Pathdelay

The path-delay fault is an important fault model used in delay testing. ... The total number of path-delay faults is twice the number of physical paths in the ...

Delay test is still a tough issue and still evolving. Rigorous delay testing also aims to detect “small defects” so as to reduce the test escape of latent.

Datapath Delay and Logic Levels - 2024.1 English. UltraFast Design Methodology Guide for FPGAs and SoCs (UG949). Document ID: UG949; Release Date: 2024-05- ...

The [signal] delay between a transmitter and a receiver. Path delay is often the largest contributor to time transfer uncertainty.

由 H Wittmann 著作 · 1995 · 被引用 17 次 — Abstract: Path delay fault test generation for standard scan design is topic of this work. A twenty-valued and a nine-valued logic are presented that are ...

Timing is closed when the critical path is no longer a failure (has at least 0 slack). The term is also used in a larger sense in an architecture - you can ...

由 王大中 著作 · 2006 — Abstract In high-performance system, it is difficult to speed up combinational circuits simply by reducing their critical path delays. Therefore, for the ...

由 謝旻廷 著作 · 2008 — 使用功能敏化路徑方法產生高品質延遲缺陷樣本 · High Quality Pattern Generation for Delay Defects with Functional Sensitized Paths · 摘要 · 關鍵字 · 並列摘要 ...

An Adaptive Path Selection Method for Delay Testing · 鍾文邦 · Wen-Ben Jone · 碩士 · 國立中正大學.